Scheme of the experimental apparatus.
(a) Points: transmittance of white light for Δ′ = −1.0 mm. Line: Lorentzian fit to data. (b) Transmittance of white light for different distance Δ′. (c) Points: measured FSR−1 as a function of Δ′. Line: linear fit to data. (d) Calculated FSR as a function of Δ′ and Δ for different photon energy (E1 = 1.907 μeV, E2 = 1.77 μeV, E3 = 1.653 μeV).
(a) Squares (Circles): APD count rate with feedback on (off) registered over 8 h (2 h and 30 min) as function of time. The inset shows the first 20 min. (b) Statistic of the APD count rate registered over 8 h with feedback on.
(a) PL spectrum of a single GaAs QD. (b) Colour-intensity map of 40 PL spectra transmitted through the FPI (Δ = 1.02 mm, = 597 μeV) as a function of photon energy (x axis) and piezo voltage (y axis). Black corresponds to the dark background and white is the maximum count rate. The white dashed lines define the integration window for evaluating the intensity of transmitted PL as shown in graph (c). (c) Transmitted PL intensity as a function of the piezo voltage as obtained by graph (b).
(a) Unpolarized spectrum of a single DE QD. (b) From left to right panels: X−, XX, X+, and X polarized PL as measured with spectrometer and CCD. (c) From left to right panels: colour-intensity map of a FP scan on XX, X+, and X unpolarized PL.
(a) Colour-intensity maps of transmitted PL spectra of X+ for different excitation power. White corresponds to the maximum count rate. (b) Intensity profiles of X+ transmitted PL as a function of the energy shift for different excitation power. Squares and lines represent the measured data and Lorentzian fits, respectively. (c) Line broadening as a function of excitation power.
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