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X-ray luminescence based spectrometer for investigation of scintillation properties
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10.1063/1.4764772
/content/aip/journal/rsi/83/10/10.1063/1.4764772
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/10/10.1063/1.4764772
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Figures

Image of FIG. 1.
FIG. 1.

A schematic drawing of x-ray induced luminescence spectrometer. The dashed line represents the shielded chamber.

Image of FIG. 2.
FIG. 2.

X-ray luminescence spectra of a number of undoped YAG samples grown under different atmospheres. The spectra were recorded using 65 s integration.

Image of FIG. 3.
FIG. 3.

X-ray luminescence spectra of Ce-doped YAG samples of different growth environment and post-growth treatment. The samples grown in a mixed atmosphere of argon and hydrogen have 0.15 at. % Ce and the samples grown in a pure argon atmosphere have 0.3 at. % Ce. Annealing was carried out in air at 1200 °C for 48 h. The spectra were recorded using (a) 20 s integration and (b) 65 s integration.

Image of FIG. 4.
FIG. 4.

(a) Luminescence spectra at various x-ray powers, (b) The light yield calculated by taking the integrated 530 nm peak versus x-ray power, for Ce (0.15%) doped YAG.

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/content/aip/journal/rsi/83/10/10.1063/1.4764772
2012-10-31
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X-ray luminescence based spectrometer for investigation of scintillation properties
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/10/10.1063/1.4764772
10.1063/1.4764772
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