A schematic drawing of x-ray induced luminescence spectrometer. The dashed line represents the shielded chamber.
X-ray luminescence spectra of a number of undoped YAG samples grown under different atmospheres. The spectra were recorded using 65 s integration.
X-ray luminescence spectra of Ce-doped YAG samples of different growth environment and post-growth treatment. The samples grown in a mixed atmosphere of argon and hydrogen have 0.15 at. % Ce and the samples grown in a pure argon atmosphere have 0.3 at. % Ce. Annealing was carried out in air at 1200 °C for 48 h. The spectra were recorded using (a) 20 s integration and (b) 65 s integration.
(a) Luminescence spectra at various x-ray powers, (b) The light yield calculated by taking the integrated 530 nm peak versus x-ray power, for Ce (0.15%) doped YAG.
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