1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device
Rent:
Rent this article for
USD
10.1063/1.4769258
/content/aip/journal/rsi/83/12/10.1063/1.4769258
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/12/10.1063/1.4769258
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) View of the cryogenic microscope head suspended on a 10 cm-high copper frame: (i) piezoelectric scanner tubes, (ii) AFM/STM probe, (iii) sample holder, (iv) micro-coax filters, (v) Attocube piezo-electric positioners, and (vi) mechanical isolation springs. (b) Zoom-in picture on the AFM/STM probe showing the tungsten tip glued by silver epoxy on a quartz tuning fork, here without its shielding box. (c) Schematic of the circuit connecting the SNS sample, enabling to simultaneously perform I(V) transport experiments and local tunnel spectroscopies I T (V T ).

Image of FIG. 2.
FIG. 2.

Operation of the coarse positioning system at a bath temperature of 90 mK. (a) AFM topographical image of a tracking symbol. (b) Superposed images after a move in − Y and + Y directions, with 8 pulses of 45 V amplitude. (c) Superposed images after − X and + X movements, with 3 pulses of 45 V amplitude. (d) Temperature evolution of the refrigerator cold plate due to a X, Y, or Z piezo-electric positioners displacement of 10 steps at a 45 V bias amplitude.

Image of FIG. 3.
FIG. 3.

Scanning electron microscopy image showing the pattern of different symbols used to localize by AFM the sample at low temperature. Added on top of this image, the AFM pictures and associated numbers represent the different steps of a typical localization procedure performed at 90 mK. On the left: zoom on one of the low resolution image recorded during this procedure.

Image of FIG. 4.
FIG. 4.

Typical measurements obtained with our cryogenic AFM/STM on a hybrid Josephson junction at 90 mK. (a) AFM image of the Al/Cu/Al junction. The cross indicates where spectroscopies in out-of-equilibrium conditions were realized, see Fig. 5(b). (b) Color plot of local spectroscopic data dI T /dV T (V T ) performed every 100 nm along the dotted arrow with a tunnel resistance of 10 .

Image of FIG. 5.
FIG. 5.

Typical measurements obtained with our cryogenic AFM/STM on a hybrid Josephson junction at 90 mK. (a) and (b) current-voltage characteristics I(V) of the junction measured as described in Fig. 1(c) and over two different bias current ranges. Some hysteresis is observed. (c) Local spectroscopic data dI T /dV T (V T ) measured on one aluminum lead, see Fig. 4, while current-biasing the sample close to the local critical current of the lead.

Loading

Article metrics loading...

/content/aip/journal/rsi/83/12/10.1063/1.4769258
2012-12-06
2014-04-25
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/12/10.1063/1.4769258
10.1063/1.4769258
SEARCH_EXPAND_ITEM