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Effect of multiplicative noise on least-squares parameter estimation with applications to the atomic force microscope
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10.1063/1.4709496
/content/aip/journal/rsi/83/5/10.1063/1.4709496
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/5/10.1063/1.4709496
/content/aip/journal/rsi/83/5/10.1063/1.4709496
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/content/aip/journal/rsi/83/5/10.1063/1.4709496
2012-05-16
2014-07-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of multiplicative noise on least-squares parameter estimation with applications to the atomic force microscope
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/5/10.1063/1.4709496
10.1063/1.4709496
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