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Quantitative measurement of hard x-ray spectra for high intensity laser produced plasma
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Image of FIG. 1.
FIG. 1.

Schematic of the Laue spectrometer system.

Image of FIG. 2.
FIG. 2.

Detection energy range for Type-I and Type-II setups in the Laue spectrometer. Position “0” represents the center of the detectors.

Image of FIG. 3.
FIG. 3.

Decay of outputs for the Fuji BAS-TR imaging plate given as a function of time after exposure.

Image of FIG. 4.
FIG. 4.

IP sensitivity per x-ray photon as a function of exposure time for the fading time of 30 min.

Image of FIG. 5.
FIG. 5.

Spectral sensitivity of CsI/CCD detector, compared with experimental data at 59.5 and 662 keV.

Image of FIG. 6.
FIG. 6.

(a) The spectral images for Ag Kα and Kβ emission, respectively, at 22 and 25 keV; (b) the spectral signal obtained with the single photon counting CCD.

Image of FIG. 7.
FIG. 7.

Intensity of Kα lines from Laue spectrometer are in proportion to the absolute Kα yield for laser produce plasma.

Image of FIG. 8.
FIG. 8.

Integrated reflectivity calculated with XOP code, compared with the experiments for three different sources.

Image of FIG. 9.
FIG. 9.

Overall sensitivity of Laue spectrometer system with CsI/CCD detector. The solid line represents a product of spectral sensitivities for the crystal and CsI/CCD. Experimental data points are also plotted for comparison. A good agreement is obtained between the theoretical prediction and the experiments.

Image of FIG. 10.
FIG. 10.

Experimentally measured Kα conversion efficiency vs laser intensity on x-ray source targets.


Generic image for table
Table I.

The distance a, b, and c in Fig. 1.

Generic image for table
Table II.

Calibration of the spectrometer system with LPP and RIs. IP: Imaging plate; C: CsI/CCD; LC: Laue crystal; LPP: laser produced plasma, and RI: radioisotope.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Quantitative measurement of hard x-ray spectra for high intensity laser produced plasma