Schematic of the Laue spectrometer system.
Detection energy range for Type-I and Type-II setups in the Laue spectrometer. Position “0” represents the center of the detectors.
Decay of outputs for the Fuji BAS-TR imaging plate given as a function of time after exposure.
IP sensitivity per x-ray photon as a function of exposure time for the fading time of 30 min.
Spectral sensitivity of CsI/CCD detector, compared with experimental data at 59.5 and 662 keV.
(a) The spectral images for Ag Kα and Kβ emission, respectively, at 22 and 25 keV; (b) the spectral signal obtained with the single photon counting CCD.
Intensity of Kα lines from Laue spectrometer are in proportion to the absolute Kα yield for laser produce plasma.
Integrated reflectivity calculated with XOP code, compared with the experiments for three different sources.
Overall sensitivity of Laue spectrometer system with CsI/CCD detector. The solid line represents a product of spectral sensitivities for the crystal and CsI/CCD. Experimental data points are also plotted for comparison. A good agreement is obtained between the theoretical prediction and the experiments.
Experimentally measured Kα conversion efficiency vs laser intensity on x-ray source targets.
The distance a, b, and c in Fig. 1.
Calibration of the spectrometer system with LPP and RIs. IP: Imaging plate; C: CsI/CCD; LC: Laue crystal; LPP: laser produced plasma, and RI: radioisotope.
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