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The thermal flash technique: The inconsequential effect of contact resistance and the characterization of carbon nanotube clusters
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10.1063/1.4717733
/content/aip/journal/rsi/83/5/10.1063/1.4717733
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/5/10.1063/1.4717733
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Schematic of the experimental setup for the thermal flash method. (b) A sample experimental data showing the drop in voltage across the sensor resulting from contact with the nanostructure.

Image of FIG. 2.
FIG. 2.

Plots showing analytical predictions of normalized temperature (at x = 0) for a nanostructure of 100 μm length as a function of time as obtained from equations with and without terms acccounting for the presence of contact resistance. The different combinations of diffusivity and contact resistance used for the illustration were (a) 7 × 10−4 m2/s and 8 × 10−8 m2 K/W, (b) 7 × 10−6 m2/s and 8 × 10−8 m2 K/W, and (c) 7 × 10−6 m2/s and 4 × 10−8 m2 K/W. Plot (c) was obtained by normalizing the tempertaure predictions with respect to the predictions for (b) in order to show that a change in contact resistance only affects the magnitude of the temperatures.

Image of FIG. 3.
FIG. 3.

Plots showing analytical predictions of normalized rates of change in temperature (at x = 0) for a nanostructure of 100 μm length as a function of time as obtained from equations with and without terms acccounting for the presence of contact resistance. The respective combinations of diffusivity and contact resistance were the same as the ones used for Figure 2. Plot (c) was obtained by normalizing the tempertaure predictions with respect to the predictions for (b) in order to show that a change in contact resistance only affects the magnitude of the rates.

Image of FIG. 4.
FIG. 4.

Plot of time constant calculated from Eq. (5) as a function of thermal diffusivity. The time constants calculated for different values of contact resistances fall on the same line and are only functions of the thermal diffusivity. All the calculations are based on a test length of 100 μm.

Image of FIG. 5.
FIG. 5.

Scanning electron micrographs showing (left) MWNT clusters and (right) one such cluster being lifted using the nanomanipulator probe and brought in contact with the heater/temperature sensor. More details about the experimental setup can be found in Ref. 13. It should be noted that the nanotubes constituting the cluster are not straight and the direct path of heat flow between the heater/temperature sensor and the nanomanipulator certainly consists of numerous interfaces.

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/content/aip/journal/rsi/83/5/10.1063/1.4717733
2012-05-29
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The thermal flash technique: The inconsequential effect of contact resistance and the characterization of carbon nanotube clusters
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/5/10.1063/1.4717733
10.1063/1.4717733
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