No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Two-step controllable electrochemical etching of tungsten scanning probe microscopy tips
12. J. P. Ibe, J. P. P. Bey, S. L. Brandow, R. A. Brizzolara, N. A. Burnham, D. P. DiLella, K. P. Lee, C. R. K. Marrian, and R. J. Colton, J. Vac. Sci. Technol. A 8, 3570 (1990).
42. H. Al-Falih, Y. Khan, Y. Zhang, D. San-Roman-Alerigi, D. Cha, B. S. Ooi, and T. K. Ng, in High Capacity Optical Networks and Enabling Technologies (HONET), 2011 (2011), pp. 190–192.
43. S. W. S. Joseph and W. Lyding, “Nanometer-scale sharpening of conductor tips,” U.S. patent 8,070,920 (2011).
45. Y. Khan and J. Randall, in Proceedings of the Eighth International Conference on Information Technology: New Generations (ITNG) (2011), pp. 965–969.
Article metrics loading...
Dynamic electrochemicaletching technique is optimized to produce tungsten tips with controllable shape and radius of curvature of less than 10 nm. Nascent features such as “dynamic electrochemicaletching” and reverse biasing after “drop-off” are utilized, and “two-step dynamic electrochemicaletching” is introduced to produce extremely sharp tips with controllable aspect ratio. Electronic current shut-off time for conventional dc “drop-off” technique is reduced to ∼36 ns using high speed analog electronics. Undesirable variability in tip shape, which is innate to static dc electrochemicaletching, is mitigated with novel “dynamic electrochemicaletching.” Overall, we present a facile and robust approach, whereby using a novel etchant level adjustment mechanism, 30° variability in cone angle and 1.5 mm controllability in cone length were achieved, while routinely producing ultra-sharp probes.
Full text loading...
Most read this month