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A combined surface stress and magneto-optical Kerr effect measurement setup for temperatures down to 30 K and in fields of up to 0.7 T
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) Scheme of the cryostat system and enlarged schematic view of the sample holder and cantilever crystal, which can be cooled down to ; (b) front view of the sample holder with 1: copper braid, 2: Mo sample clamp, 3: Pt(111) cantilever crystal, 4: Ta shield, 5: fluorescent screen; (c) view from the backside with 6: tilt rod, 7: e-beam filament, 8: W heat shield.

Image of FIG. 2.
FIG. 2.

Scheme of the crystal curvature stress measurement. 1: sample holder, 2: cantilever crystal, 3: adsorbate or film, 4: laser, 5: beam splitter, 6: adjustable mirrors, 7: piezo actuator, 8: split photodetector. The dashed box shows an enlarged view of one of the split photodetectors. The wires A and B of each sensitive area of the diode are connected to an amplifier, which delivers the sum-signal A + B as well as the difference A − B.

Image of FIG. 3.
FIG. 3.

Calibration measurement to convert the position signal difference ΔU Pos from the upper and lower laser beams into a beam displacement. The detectors are displaced by by the piezo drive (part 7 in Fig. 2). (a) Raw position voltage signal, (b) position change in . The arrow indicates that the signal change corresponds to displacement of the laser beams on the detectors.

Image of FIG. 4.
FIG. 4.

(a) Front view of the lower part of the UHV system. The glass tube (1) of the UHV chamber is situated in the center between the yokes of the electromagnet (grey). 2: Hall probe,39 3: mirrors for deflecting the laser beam onto the sample; (b) Scheme of the setup for longitudinal and polar MOKE measurements. A rotation of the sample by 90° (dashed lines) allows measurements in polar geometry .

Image of FIG. 5.
FIG. 5.

Surface stress and LEED measurements during film growth of 5 ML Co on Pt(111) at . The red curve shows a tensile stress change, indicative of the residual strain in the film. The top row shows LEED images at 139 eV taken before and after film growth. The zoom-in (inverted) indicates satellites spots surrounding the central diffraction spot.

Image of FIG. 6.
FIG. 6.

Surface stress and LEED measurements during condensation of Xe on Pt(111) at . The red curve shows a compressive stress change upon exposure of the clean Pt(111) surface to Xe at a partial pressure (blue curve) of 1 × 10−7 mbar for . The top row LEED images are taken at 87 eV before and after Xe exposure. Upon Xe exposure an area of blurred diffracted intensity is found within the Pt first order diffraction peaks.

Image of FIG. 7.
FIG. 7.

Magneto-optical Kerr-effect measurements in longitudinal and polar geometry at 300 K. (a), (b) MOKE signal upon reflection from Pt(111), without glass cylinder. (c), (d) with glass cylinder. (e), (f) with Co monolayers and glass cylinder. (g), (h) from (e), (f) after background subtraction. For detailed explanations see text.

Image of FIG. 8.
FIG. 8.

MOKE of Co films with a thickness of 2.5 ML (a),(b) and 5 ML (c),(d) on Pt(111) in longitudinal and polar geometry, respectively. The 2.5 ML Co film shows an easy out-of-plane axis of magnetization, whereas it is in-plane for 5 ML. Faraday and Voigt effects have been subtracted.

Image of FIG. 9.
FIG. 9.

Longitudinal MOKE measurement of 10 ML Co/Pt(111). The red curve shows the MOKE signal at , the blue at . No background subtraction has been performed.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A combined surface stress and magneto-optical Kerr effect measurement setup for temperatures down to 30 K and in fields of up to 0.7 T