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An instrument for 3D x-ray nano-imaging
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/content/aip/journal/rsi/83/7/10.1063/1.4737624
2012-07-26
2014-08-20

Abstract

We present an instrument dedicated to 3D scanning x-ray microscopy, allowing a sample to be precisely scanned through a beam while the angle of x-ray incidence can be changed. The position of the sample is controlled with respect to the beam-defining optics by laser interferometry. The instrument achieves a position stability better than 10 nm standard deviation. The instrument performance is assessed using scanning x-ray diffractionmicroscopy and we demonstrate a resolution of 18 nm in 2D imaging of a lithographic test pattern while the beam was defined by a pinhole of 3 μm in diameter. In 3D on a test object of copper interconnects of a microprocessor, a resolution of 53 nm is achieved.

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Scitation: An instrument for 3D x-ray nano-imaging
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/7/10.1063/1.4737624
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