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Feasibility study for mega-electron-volt electron beam tomography
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Image of FIG. 1.
FIG. 1.

Experimental setup: complete view with electron beam accelerator (left), detailed view of the x-ray scanning area (top right), and cross-sectional view of the target area (bottom right).

Image of FIG. 2.
FIG. 2.

Room-temperature semiconductor detector (left) and LSO-APD detector (right).

Image of FIG. 3.
FIG. 3.

Phantoms for experimental studies.

Image of FIG. 4.
FIG. 4.

Fan-beam projection geometry (left), raw detector signal obtained from scanning of the six-hole phantom (centre), and gray value representation of the resulting projection sinogram (right).

Image of FIG. 5.
FIG. 5.

Detector signal with and without x-ray exposure.

Image of FIG. 6.
FIG. 6.

Overlaid signal sequences from several electron beam sweeps.

Image of FIG. 7.
FIG. 7.

Intensity signal and its derivative for knife-edge absorber scan.

Image of FIG. 8.
FIG. 8.

Scan of a wedge absorber (top), the corresponding raw detector signal (bottom left) and measured attenuation profile (bottom right).

Image of FIG. 9.
FIG. 9.

Sinogram (left) and reconstructed image of the six-hole phantom (right).

Image of FIG. 10.
FIG. 10.

Profile of the aluminium insert along the dotted line (left and centre) and regions for the CNR analysis (right).

Image of FIG. 11.
FIG. 11.

Sinogram (left) and reconstructed image of the rod bundle phantom (right).


Generic image for table
Table I.

Detector properties.

Generic image for table
Table II.

SNR and CNR values of selected regions for air and PMMA.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Feasibility study for mega-electron-volt electron beam tomography