Experimental setup: complete view with electron beam accelerator (left), detailed view of the x-ray scanning area (top right), and cross-sectional view of the target area (bottom right).
Room-temperature semiconductor detector (left) and LSO-APD detector (right).
Phantoms for experimental studies.
Fan-beam projection geometry (left), raw detector signal obtained from scanning of the six-hole phantom (centre), and gray value representation of the resulting projection sinogram (right).
Detector signal with and without x-ray exposure.
Overlaid signal sequences from several electron beam sweeps.
Intensity signal and its derivative for knife-edge absorber scan.
Scan of a wedge absorber (top), the corresponding raw detector signal (bottom left) and measured attenuation profile (bottom right).
Sinogram (left) and reconstructed image of the six-hole phantom (right).
Profile of the aluminium insert along the dotted line (left and centre) and regions for the CNR analysis (right).
Sinogram (left) and reconstructed image of the rod bundle phantom (right).
SNR and CNR values of selected regions for air and PMMA.
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