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Schematic of a system used for measuring SPR in the Kretschmann-Raether configuration.
Variation of the incidence angle of the reflected beam on the photodiode surface for different geometries (a) when the stage with the sample rotates and the photodiode is fixed, (b) when the photodiode rotates with the sample stage, and (c) when the sample stage and the photodiode are fixed and the laser beam changes the incidence direction.
Photodiode signal (photocurrent mode) obtained by varying the incidence angle for different wavelengths and polarizations and the fit to a second degree polynomial function for the p-polarization curves.
Average SPR curves for (a) 50 nm Au film and (b) 50 nm Au film + 20 nm Co-phthalocyanine deposited onto sodalime glass obtained with two different orientations of the photodiode. The statistical error is of the same order as the line thickness.
SPR curve for (a) 50 nm Au and (b) 50 nm Au film + 20 nm Co-phthalocyanine measured with two orientations of the photodiode and corrected by the angular dependence of the photodiode sensitivity. The statistical error is of the same order as the line thickness.
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