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Rapid preparation of electron beam induced deposition Co magnetic force microscopy tips with 10 nm spatial resolution
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10.1063/1.4752225
/content/aip/journal/rsi/83/9/10.1063/1.4752225
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/9/10.1063/1.4752225
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

A Co spike tip with an extended basis shown in (a) and a Co spike tip with a compact base is shown in (b). Both bases have the same volume of Co; the base volume to tip volume ratios are approximately 11.

Image of FIG. 2.
FIG. 2.

An image of bit patterned media specimen with perpendicular anisotropy imaged with a spike + base tip is shown. The topography is shown in (a) and the MFM image is in (b). In the MFM image the lighter (darker) the color the more attractive (repulsive) is the tip-sample interaction. Underneath both images is a single line trace for the lines shown in the images. The spacing between the vertical lines in the MFM single line trace is 9 nm which is slightly more than the average value of 8.5 nm from 22 measurements of the transition width across the separation between the two bits.

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/content/aip/journal/rsi/83/9/10.1063/1.4752225
2012-09-26
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Rapid preparation of electron beam induced deposition Co magnetic force microscopy tips with 10 nm spatial resolution
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/9/10.1063/1.4752225
10.1063/1.4752225
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