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Sensitivity maximized near-field scanning optical microscope with dithering sample stage
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10.1063/1.4754290
/content/aip/journal/rsi/83/9/10.1063/1.4754290
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/9/10.1063/1.4754290
/content/aip/journal/rsi/83/9/10.1063/1.4754290
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/content/aip/journal/rsi/83/9/10.1063/1.4754290
2012-09-21
2014-09-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Sensitivity maximized near-field scanning optical microscope with dithering sample stage
http://aip.metastore.ingenta.com/content/aip/journal/rsi/83/9/10.1063/1.4754290
10.1063/1.4754290
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