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Ultrafast optical technique for measuring the electrical dependence of the elasticity of piezoelectric thin film: Demonstration on AlN
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10.1063/1.4788936
/content/aip/journal/rsi/84/1/10.1063/1.4788936
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/1/10.1063/1.4788936
/content/aip/journal/rsi/84/1/10.1063/1.4788936
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/content/aip/journal/rsi/84/1/10.1063/1.4788936
2013-01-29
2014-10-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ultrafast optical technique for measuring the electrical dependence of the elasticity of piezoelectric thin film: Demonstration on AlN
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/1/10.1063/1.4788936
10.1063/1.4788936
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