1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Note: Accurate determination of thickness of multiple layers of thin film deposited on a piezoelectric quartz crystal
Rent:
Rent this article for
USD
10.1063/1.4825036
/content/aip/journal/rsi/84/10/10.1063/1.4825036
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/10/10.1063/1.4825036
View: Tables

Tables

Generic image for table
Table I.

Layer errors in Cu-Al thin film stack.

Generic image for table
Table II.

Layer errors in Ba-Y-Cu thin film stack.

Loading

Article metrics loading...

/content/aip/journal/rsi/84/10/10.1063/1.4825036
2013-10-11
2014-04-21
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Note: Accurate determination of thickness of multiple layers of thin film deposited on a piezoelectric quartz crystal
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/10/10.1063/1.4825036
10.1063/1.4825036
SEARCH_EXPAND_ITEM