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Volume 84, Issue 11 Front cover image - large version

Volume 84, Issue 11, November 2013

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FEATURED ARTICLE
  • Invited Review Article: Methods for imaging weak-phase objects in electron microscopy
  • INVITED REVIEW ARTICLE
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Scitation: Review of Scientific Instruments - Volume 84, Issue 11
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/11
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