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/content/aip/journal/rsi/84/11/10.1063/1.4827076
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/content/aip/journal/rsi/84/11/10.1063/1.4827076
2013-11-01
2016-12-11

Abstract

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure.

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