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Scanning probe image wizard: A toolbox for automated scanning probe microscopy data analysis
4. M. Raposo, Q. Ferreira, and P. A. Ribeiro, A Guide for Atomic Force Microscopy Analysis of Soft-Condensed Matter (Formatex, 2007), pp. 758–769.
14. R. C. Gonzalez and R. E. Woods, Digital Image Processing, 2nd ed. (Prentice-Hall, Inc., 2002), p. 137.
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We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure.
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