1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources
Rent:
Rent this article for
USD
10.1063/1.4788732
/content/aip/journal/rsi/84/2/10.1063/1.4788732
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/2/10.1063/1.4788732
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Top view of the XUV spectrometer: The synchrotron focus is imaged with a toroidal mirror to the CCD detector. A transmission grating induces dispersion to the XUV beam.

Image of FIG. 2.
FIG. 2.

Synchrotron beam recorded with the CCD at a photon energy of 80 eV. Thin-foil XUV filters are used to block higher orders of XUV radiation. The supporting mesh is imaged on the CCD camera. The aperture of the spectrometer is indicated as a white rectangle. Only a fraction of 10−4 of the beam intensity is not captured with the aperture of the spectrometer.

Image of FIG. 3.
FIG. 3.

Measured absolute sensitivity κCCD of the CCD detector from 15.5 eV to 99 eV. The dashed lines indicate the confidence interval determined by the inaccuracy of the absolute sensitivity of the calibrated photodiode of 20%.

Image of FIG. 4.
FIG. 4.

Measured quantum efficiency ηCCD of the CCD detector from 15.5 eV to 99 eV. The dashed lines indicate the confidence interval determined by the inaccuracy of the absolute sensitivity of the calibrated photodiode of 20%.

Image of FIG. 5.
FIG. 5.

Raw images of the XUV spectrometer at 80 eV. Both panels display the same exposure. In order to show the full dynamic range of the instrument, the dynamic range of the color scale is larger in the lower panel, i.e., the main peaks in the upper panel are strongly saturated. The lower panel shows that the zeroth order contains most of the intensity. Approximately 10% of the intensity is diffracted in the ±1st order. The upper panel shows lower intensities with a high dynamic range. The area that is used for the spectrometer calibration is indicated with white boxes.

Image of FIG. 6.
FIG. 6.

Measured absolute sensitivity κspec of the spectrometer-detector system of −1st and zeroth order. The absolute sensitivity decreases rapidly for lower photon energies for both diffraction orders. The dashed lines indicate the confidence interval determined by the inaccuracy of the absolute sensitivity of the calibrated photodiode of 20%.

Image of FIG. 7.
FIG. 7.

Measured quantum efficiency ηspec of the spectrometer-detector system of −1st and zeroth order. The quantum efficiency is almost constant for high-energy XUV photons. It decreases significantly for smaller photon energies. The dashed lines indicate the confidence interval determined by the inaccuracy of the absolute sensitivity of the calibrated photodiode of 20%.

Image of FIG. 8.
FIG. 8.

High-harmonic spectrum in xenon driven by a 200 W, 500 fs, 1 MHz fiber chirped pulse amplification (FCPA) system.

Image of FIG. 9.
FIG. 9.

High-harmonic spectrum from the relativistic interaction of a high-intensity laser pulse (I = 3 × 1019 W/cm2) with a surface plasma. The upper panel shows the raw image of the CCD camera. The lower panel shows the calibrated lineout of the raw image.

Loading

Article metrics loading...

/content/aip/journal/rsi/84/2/10.1063/1.4788732
2013-02-04
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/2/10.1063/1.4788732
10.1063/1.4788732
SEARCH_EXPAND_ITEM