Schematic of the MLL setup used to perform scanning fluorescence experiments. Degrees of motion required to perform MLL alignment are shown in bold fonts. Central beamstop and beam defining slits are not shown.
CAD model of the MLL fluorescence microscope, key components are enumerated. 1-mount for the ion chamber and the beam defining slits (JJ X-RAY AT-F7-AIR ESRF), 2-horizontal MLL assembly, 3-vertical MLL assembly, 4-large travel range flexure based sample stage, 5-SmarAct/Piezosystem Jena scanner assembly for fine scanning of the sample, 6-Ketek fluorescence detector. The inset shows the actual photograph of the microscope installed at I13, DLS.
(a) Temperature profile of a Smaract piezo stage. The inset shows the region of the data within a box and corresponds to the temperature increase after 1, 10, and 5 mm-size steps, respectively. Note, peaks at approximately 2 and 11 h are due to false readings of the temperature controller and are not related to motion of the stage. (b) Temperature variation across the customized PI M-663 stage mounted with conductive silver paste. (c) Temperature gradient across the customized Pi M-663 stage with the interpolator removed.
Long term stability measurement at liquid nitrogen temperature. Left panel: interferometer readings as a function of time. Right panel: temperature readings on the top and bottom flanges of the cavity, the observed drift of the distance measurements correlates well with the temperature drift due to slow boiling off of liquid nitrogen.
Setup for interferometer resolution test. Left panel: photograph of the setup showing inteferometer heads (1) and PI Picocube (2). Right panel: 300 pm, 500 pm, and 1000 pm steps performed by the Picocube in the z-direction and recorded by the fiber-optic interferometer. Interferometer head-reflector separation was set to 25 mm.
(a) Thermal image of the microscope measured at the nanopositioning laboratory. All PI-M663 stages were turned on for 30 min. (b) Corresponding visible light image, locations of five stages used to manipulate and align MLL optics are marked with squares.
(a) MLL alignment part of the microscope with interferometers mounted on the special frame to monitor long term drifts of MLL optics. (b) Thermal drifts of the vertical MLL optics in X, Y, and Z directions. Measurements were acquired 3 h after the system was covered with insulating enclosure and temperature inside reached thermal equilibrium. (c) Temperature variations during the data acquisition at the location of the MLL lens and the base plate of the microscope. (d) Temperature and pressure measurements on the laboratory during drift measurements.
Fluorescence images of the Au test pattern (scan parameters: step size - 100 nm, dwell time - 1 s; note the difference in scan ranges for panels (a) and (b), respectively). (a) Horizontal axis is the fast scanning direction, (b) vertical axis is the fast scanning direction. (c) and (d) Position of the maximum in the fits to individual line scans for images (a) and (b), respectively.
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