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Note: Near-field imaging of thermal radiation at low temperatures by passive millimeter-wave microscopy
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10.1063/1.4794911
/content/aip/journal/rsi/84/3/10.1063/1.4794911
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/3/10.1063/1.4794911
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Experimental setup for passive millimeter-wave microscopy. The inset shows a block diagram of the radiometric receiver.

Image of FIG. 2.
FIG. 2.

(a) Schematic diagram of the sample. (b) Cross-sectional drawing of the sample along the dotted line in (a). (c) One-dimensional scans of the sample at various sample temperatures from 300 K to 160 K. The inset in (c) shows the scanning arrangement. The sample is 30 mm in diameter. In (a) and (b), only the area corresponding to the field of view (3 mm × 3 mm) in the imaging experiment (Fig. 3 ) is depicted.

Image of FIG. 3.
FIG. 3.

(a) Reconstructed millimeter-wave images of the sample at various sample temperatures from 260 K to 200 K. (b) Transmission map of the thermal radiation coupled to the probe. (c) Thermal images of the sample calculated from the images in (a) and (b). (d) Image intensity as a function of sample temperature for two distinct points on the reconstructed thermal images of (c) marked with crosses (×) in the inset image. The raw data sets for the images in (a) and (b) were obtained under experimental conditions in which the sampling interval for the linear scan was 50 μm, the number of sampling points was 61, the angle interval for the rotational scan was 6°, and the total number of projections (linear scans) was 31.

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/content/aip/journal/rsi/84/3/10.1063/1.4794911
2013-03-06
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Note: Near-field imaging of thermal radiation at low temperatures by passive millimeter-wave microscopy
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/3/10.1063/1.4794911
10.1063/1.4794911
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