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Experimental setup for passive millimeter-wave microscopy. The inset shows a block diagram of the radiometric receiver.
(a) Schematic diagram of the sample. (b) Cross-sectional drawing of the sample along the dotted line in (a). (c) One-dimensional scans of the sample at various sample temperatures from 300 K to 160 K. The inset in (c) shows the scanning arrangement. The sample is 30 mm in diameter. In (a) and (b), only the area corresponding to the field of view (3 mm × 3 mm) in the imaging experiment (Fig. 3 ) is depicted.
(a) Reconstructed millimeter-wave images of the sample at various sample temperatures from 260 K to 200 K. (b) Transmission map of the thermal radiation coupled to the probe. (c) Thermal images of the sample calculated from the images in (a) and (b). (d) Image intensity as a function of sample temperature for two distinct points on the reconstructed thermal images of (c) marked with crosses (×) in the inset image. The raw data sets for the images in (a) and (b) were obtained under experimental conditions in which the sampling interval for the linear scan was 50 μm, the number of sampling points was 61, the angle interval for the rotational scan was 6°, and the total number of projections (linear scans) was 31.
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