Schematic view of the vacuum chamber for measurement of Seebeck coefficient and electrical resistivity.
Top view (a) and side view (b) of the sample holder. The current leads in (a) are used to pass current in electrical resistance measurements.
Circuit diagram of measuring Seebeck coefficient. The voltage signals sensed by TC1 and TC2 are recorded by multimeters V1 and V2, respectively, while the multimeter Vs is used to measure ΔU.
Temperature variations on both sides of the sample (a), temperature difference ΔT (b), and thermoelectric voltage ΔU (c) across the sample as a function of time in a typical measurement cycle.
The plot of ΔU vs. ΔT for the heating-up run (a) and cooling-down run (b) in the measurement cycle shown in Fig. 4 . Both cases demonstrate a clear linear relationship.
Measurement of Seebeck coefficient of constantan as a function of temperature. The measured data are derived from both heating-up and cooling-down runs.
The temperature dependent Seebeck coefficient of platinum. The measured results which are obtained from both heating-up and cooling-down runs match reasonably well with the literatures.
The measured resistivity of platinum in comparison with the literature data. An exciting current of 100 mA was used in the test.
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