1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
f
Scanning noise microscopy
Rent:
Rent this article for
Access full text Article
/content/aip/journal/rsi/84/4/10.1063/1.4801458
1.
1. J. Schaffert, M. C. Cottin, A. Sonntag, H. Karacuban, C. A. Bobisch, N. Lorente, J.-P. Gauyacq, and R. Möller, Nature Mater. 12, 223227 (2013).
http://dx.doi.org/10.1038/nmat3527
2.
2. Y. Yuzhelevski, M. Yuzhelevski, and G. Jung, Rev. Sci. Instrum. 71, 1681 (2000).
http://dx.doi.org/10.1063/1.1150519
3.
3. M. J. Uren, D. J. Day, and M. J. Kirton, Appl. Phys. Lett. 47, 1195 (1985).
http://dx.doi.org/10.1063/1.96325
4.
4. K. K. Hung, P. K. Ko, C. Hu, and Y. C. Cheng, IEEE Electron Device Lett. 11, 90 (1990).
http://dx.doi.org/10.1109/55.46938
5.
5. C. M. Compagnoni et al., IEEE Trans. Electron Devices 55, 388 (2008).
http://dx.doi.org/10.1109/TED.2007.910605
6.
6. R. Soni et al., J. Appl. Phys. 107, 024517 (2010).
http://dx.doi.org/10.1063/1.3291132
7.
7. X. Wang, P. Rao, A. Mierop, and A. Theuwissen, in Proceedings of the IEEE International Electron Devices Meeting, 2006 (IEDM’06) (IEEE, 2006), pp. 14.
8.
8. R. Brederlow, R. Prakash, C. Paulus, and R. Thewes, in Proceedings of the IEEE International Solid-State Circuits Conference, 2006 (ISSCC 2006), Digest of Technical Papers (IEEE, 2006), pp. 16661675.
9.
9. C. Tokunaga, D. Blaauw, and T. Mudge, IEEE J. Solid-State Circuits 43, 78 (2008).
http://dx.doi.org/10.1109/JSSC.2007.910965
10.
10. G. Binnig and H. Rohrer, Helv. Phys. Acta 55, 726 (1982).
11.
11. M. Welland and R. Koch, Appl. Phys. Lett. 48, 724 (1986).
http://dx.doi.org/10.1063/1.96702
12.
12. D. M. Eigler, C. P. Lutz, and W. E. Rudge, Nature (London) 352, 600 (1991).
http://dx.doi.org/10.1038/352600a0
13.
13. I.-W. Lyo and P. Avouris, Science 253, 173 (1991).
http://dx.doi.org/10.1126/science.253.5016.173
14.
14. Y. Pennec et al., Phys. Rev. Lett. 96, 026102 (2006).
http://dx.doi.org/10.1103/PhysRevLett.96.026102
15.
15. A. van Houselt, R. van Gastel, B. Poelsema, and H. J. W. Zandvliet, Phys. Rev. Lett. 97, 266104 (2006).
http://dx.doi.org/10.1103/PhysRevLett.97.266104
16.
16. E. P. Smakman, J. van Bree, and P. M. Koenraad, Phys. Rev. B 87, 085414 (2013).
http://dx.doi.org/10.1103/PhysRevB.87.085414
17.
17. B. C. Stipe, M. A. Rezaei, and W. Ho, Phys. Rev. Lett. 82, 1724 (1999).
http://dx.doi.org/10.1103/PhysRevLett.82.1724
18.
18. J. Gaudioso, L. J. Lauhon, and W. Ho, Phys. Rev. Lett. 85, 1918 (2000).
http://dx.doi.org/10.1103/PhysRevLett.85.1918
19.
19. V. Iancu and S. W. Hla, Proc. Natl. Acad. Sci. U.S.A. 103, 13718 (2006).
http://dx.doi.org/10.1073/pnas.0603643103
20.
20. P. Liljeroth, J. Repp, and G. Meyer, Science 317, 1203 (2007).
http://dx.doi.org/10.1126/science.1144366
21.
21. H. Karacuban et al., Surf. Sci. 603, L39 (2009).
http://dx.doi.org/10.1016/j.susc.2009.01.029
22.
22. V. Simic-Milosevic, J. Meyer, and K. Morgenstern, Angew. Chem., Int. Ed. 48, 4061 (2009).
http://dx.doi.org/10.1002/anie.200805551
23.
23. C. Nacci et al., Nano Lett. 9, 2996 (2009).
http://dx.doi.org/10.1021/nl901419g
24.
24. Y. F. Wang, J. Kroger, R. Berndt, and W. A. Hofer, J. Am. Chem. Soc. 131, 3639 (2009).
http://dx.doi.org/10.1021/ja807876c
25.
25. A. van Houselt and H. J. W. Zandvliet, Rev. Mod. Phys. 82, 1593 (2010).
http://dx.doi.org/10.1103/RevModPhys.82.1593
26.
26. M. Parschau et al., Angew. Chem., Int. Ed. 48, 4065 (2009).
http://dx.doi.org/10.1002/anie.200805740
27.
27. K. Motobayashi, Y. Kim, H. Ueba, and M. Kawai, Phys. Rev. Lett. 105, 076101 (2010).
http://dx.doi.org/10.1103/PhysRevLett.105.076101
28.
28. B. Stadtmüller, I. Kröger, F. Reinert, and C. Kumpf, Phys. Rev. B 83, 085416 (2011).
http://dx.doi.org/10.1103/PhysRevB.83.085416
29.
29. P. Zahl, M. Bierkandt, S. Schröder, and A. Klust, Rev. Sci. Instrum. 74, 1222 (2003).
http://dx.doi.org/10.1063/1.1540718
30.
30. P. Zahl, T. Wagner, R. Möller, and A. Klust, J. Vac. Sci. Technol. B 28, C4E39 (2010).
http://dx.doi.org/10.1116/1.3374719
31.
31. I. Horcas, R. Fernández, J. M. Gómez-Rodríguez, J. Colchero, J. Gómez-Herrero, and A. M. Baro, Rev. Sci. Instrum. 78, 013705 (2007).
http://dx.doi.org/10.1063/1.2432410
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/4/10.1063/1.4801458
Loading
/content/aip/journal/rsi/84/4/10.1063/1.4801458
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/rsi/84/4/10.1063/1.4801458
2013-04-16
2014-08-23

Abstract

The paper describes a simple scheme enabling the real-time characterization of fluctuations, e.g., of the conductance in scanning tunneling microscopy. The technique can be used in parallel to other data acquisition, evaluating the rate, the amplitude, and the duty cycle of telegraphic noise in the tunneling current. This kind of scanning probe microscopy allows to evaluate the noise parameters as a function of the average tunneling current, the electron energy, and the lateral position. Images of the noise with Ångstrom spatial resolution are acquired simultaneously to the topographic information providing a direct correlation between the structural information and the noise. The method can be applied to a large variety of systems to monitor dynamics on the nanoscale, e.g., the localization of tunneling current induced switching within a single molecule. Noise spectroscopy may reveal the involved molecular orbitals, even if they cannot be resolved in standard scanning tunneling spectroscopy. As an example we present experimental data of the organic molecule copper phthalocyanine on a Cu(111) surface[J. Schaffert, M. C. Cottin, A. Sonntag, H. Karacuban, C. A. Bobisch, N. Lorente, J.-P. Gauyacq, and R. Möller, Nature Mater.12, 223–227 (Year: 2013)10.1038/nmat3527].

Loading

Full text loading...

/deliver/fulltext/aip/journal/rsi/84/4/1.4801458.html;jsessionid=4caoc4357mk76.x-aip-live-02?itemId=/content/aip/journal/rsi/84/4/10.1063/1.4801458&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/rsi
true
true
This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Scanning noise microscopy
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/4/10.1063/1.4801458
10.1063/1.4801458
SEARCH_EXPAND_ITEM