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Electrokinetic microscopy: A technique for imaging three-dimensional surface topography and heterogeneity of surface material
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10.1063/1.4802256
/content/aip/journal/rsi/84/4/10.1063/1.4802256
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/4/10.1063/1.4802256
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic representation of distributions of ions and electric potential profile at negatively charged solid-solution interface.

Image of FIG. 2.
FIG. 2.

(a) Electrolyte flow through and (b) conceptual image of flow path.

Image of FIG. 3.
FIG. 3.

(a) Schematic diagram and (b) photograph of experimental setup.

Image of FIG. 4.
FIG. 4.

(a) SEM image of the test specimen and (b) topological change of test specimen obtained using surface profiling system.

Image of FIG. 5.
FIG. 5.

One-dimensional scan results obtained using a probe with a ID of 50 μm for specimen represented in Fig. 4(a) : (a) cross-sectional view of the specimen, (b) topological data of EKM, and (c) streaming potential data of EKM.

Image of FIG. 6.
FIG. 6.

Two-dimensional scan results obtained using a probe with a ID of 50 μm: (a) SEM image of the test specimen, (b) topography micrograph, and (c) heterogeneity micrograph measured by the EKM.

Image of FIG. 7.
FIG. 7.

Relationships (a) between streaming potential and relative distance and (b) between streaming potential and pressure difference.

Image of FIG. 8.
FIG. 8.

Experimental results for the conductor surface materials: (a) Ag and Si3N4, and (b) Alumel and Si3N4.

Image of FIG. 9.
FIG. 9.

Effect of the probe size on the lateral resolution of the EKM: (a) cross-sectional view of the test specimen with 250 μm width pattern, (b) one-dimensional scan results with a probe of 50 μm ID, and (c) of 150 μm ID.

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/content/aip/journal/rsi/84/4/10.1063/1.4802256
2013-04-29
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrokinetic microscopy: A technique for imaging three-dimensional surface topography and heterogeneity of surface material
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/4/10.1063/1.4802256
10.1063/1.4802256
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