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Separate-type scanner and wideband high-voltage amplifier for atomic-resolution and high-speed atomic force microscopy
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10.1063/1.4802262
/content/aip/journal/rsi/84/4/10.1063/1.4802262
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/4/10.1063/1.4802262

Figures

Image of FIG. 1.
FIG. 1.

Schematic models of the developed (a) XY and (b) Z scanners.

Image of FIG. 2.
FIG. 2.

Sample holding mechanisms using (a) glue, (b) magnet, and (c) screw. (i) Schematic models. (ii) Frequency response calculated by FEA. (iii) Frequency response measured by AFM.

Image of FIG. 3.
FIG. 3.

Vibration modes of the XY scanner calculated by FEA. (a) Mode 1 and (b) Mode 2 corresponding to Peaks 1 and 2 in Fig. 2 (ii), respectively.

Image of FIG. 4.
FIG. 4.

Cantilever holding mechanisms using (a) glue, (b) plate spring, and (c) screw. (i) Schematic models. (ii) Frequency response calculated by FEA. (iii) Frequency response measured by an interferometer.

Image of FIG. 5.
FIG. 5.

Vibration modes of the Z scanner calculated by FEA. Modes 1–4 correspond to Peaks 1–4 indicated in Fig. 4 (ii), respectively.

Image of FIG. 6.
FIG. 6.

Schematic diagrams of the developed high-voltage amplifiers for the (a) Z and (b) X scanners.

Image of FIG. 7.
FIG. 7.

Frequency response of the developed HVAs. (a) Amplitude curve. (b) Phase curve.

Image of FIG. 8.
FIG. 8.

Output voltage spectral density distribution of the developed X and Z HVAs measured with and without a capacitive load.

Image of FIG. 9.
FIG. 9.

Frequency response of the tip-sample distance feedback regulation measured with the developed scanners and HVAs. The measurement was performed in contact-mode AFM in liquid.

Image of FIG. 10.
FIG. 10.

Contact-mode AFM images of mica in PBS solution obtained with the developed scanners and HVAs. The screw holding mechanism was used for both the sample and cantilever holders. Scan rate: 78.125 Hz. Imaging speed: 0.82 s/frame. Pixels: 128 × 64 pix. For (a)–(d), v t = 0.39, 0.59, 1.17, and 1.56 μm/s, f cr = 0.75, 1.13, 2.25, and 3 kHz, z pp = 3.93, 3.79, 3.38, and 3.29 pm, respectively.

Image of FIG. 11.
FIG. 11.

Snapshots of 66 successive contact-mode AFM images of the calcite crystal growth process in water (see video in the supplementary material). 17 (a) 0 s. (b) 20 s. (c) 40 s. (d) 60 s. The screw holding mechanism was used for both the sample and cantilever holders. Scan size: 20 × 10 nm2. Scan rate: 100 Hz. Imaging speed: 2 s/frame. Pixel size: 200 × 200 pix. Tip velocity: 4 μm/s.

Tables

Generic image for table
Table I.

Specifications of the developed Z and XY scanners and HVAs.

Generic image for table
Table II.

Performance of the developed HVA and the commercially available ones.

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/content/aip/journal/rsi/84/4/10.1063/1.4802262
2013-04-23
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Separate-type scanner and wideband high-voltage amplifier for atomic-resolution and high-speed atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/4/10.1063/1.4802262
10.1063/1.4802262
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