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Optical design of the short pulse x-ray imaging and microscopy time-angle correlated diffraction beamline at the Advanced Photon Source
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10.1063/1.4804197
/content/aip/journal/rsi/84/5/10.1063/1.4804197
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/5/10.1063/1.4804197

Figures

Image of FIG. 1.
FIG. 1.

Total flux emitted in the central cone by the 2.1 m long revolver undulator in the first (solid line) and third harmonic (dashed line) when using the 3 cm period device and emitted in the first harmonic (dotted-dashed line) by the 2.7 cm device. The current in the storage ring is 150 mA.

Image of FIG. 2.
FIG. 2.

Log (base 10) of the number of rays as a function of time and vertical angle when accepting the full horizontal fan (see text).

Image of FIG. 3.
FIG. 3.

Log (base 10) of number of rays as a function of time and vertical angle when accepting 50 μrad horizontally.

Image of FIG. 4.
FIG. 4.

SD of the vertical size of the electron distribution (○) and its convolution with the photon beam (△: central cone; ×: SH late pulse; □: SH early pulse) as a function of the longitudinal distance. Zero meter corresponds to the center of the undulator.

Image of FIG. 5.
FIG. 5.

Log (base 10) of the number of rays as a function of time and vertical position at 0.76 m downstream from the center of the undulator; i.e., where the radiation has its vertical waist.

Image of FIG. 6.
FIG. 6.

Optical layout of the SPXIM beamline.

Image of FIG. 7.
FIG. 7.

Energy resolution of a flat Si⟨220⟩ crystal followed by the sagittally bent crystal (red line); two flats (green circles). Right axis: (for trace labeled pPol2) p reflectivity of two flat ⟨220⟩ Si with collimated light.

Image of FIG. 8.
FIG. 8.

Flux density (scale in units of photons/s/μm) at the slit plane when using the Si⟨220⟩ crystals. The caption above the figure gives the total flux (in units of photons/s) as well as the standard deviations of the beam size along the horizontal and vertical directions.

Image of FIG. 9.
FIG. 9.

Log (base 10) of the intensity at the sample position as a function of time and vertical angle. Upper trace (centered around 0 ps): With fully opened vertical slit; lower trace (shifted by −70 ps to make it visible in the figure) after a 25 μm slit.

Image of FIG. 10.
FIG. 10.

Flux density (scale in units of photons/s/μm) at the sample position at the energy resolution of the Si⟨220⟩ DCM. The caption above the figure as in Fig. 8 .

Tables

Generic image for table
Table I.

Position of the optical elements relative to the straight section center.

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/content/aip/journal/rsi/84/5/10.1063/1.4804197
2013-05-10
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical design of the short pulse x-ray imaging and microscopy time-angle correlated diffraction beamline at the Advanced Photon Source
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/5/10.1063/1.4804197
10.1063/1.4804197
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