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Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt control
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10.1063/1.4805108
/content/aip/journal/rsi/84/5/10.1063/1.4805108
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/5/10.1063/1.4805108
/content/aip/journal/rsi/84/5/10.1063/1.4805108
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/content/aip/journal/rsi/84/5/10.1063/1.4805108
2013-05-23
2014-11-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt control
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/5/10.1063/1.4805108
10.1063/1.4805108
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