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Compact integrated X-ray intensity and beam position monitor based on rare gas scintillation
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10.1063/1.4807698
/content/aip/journal/rsi/84/5/10.1063/1.4807698
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/5/10.1063/1.4807698
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) The cross-section diagram of the compact Ar-scintillation monitor. (b) Photograph of the actual device.

Image of FIG. 2.
FIG. 2.

(a) Diagram of the experimental setup at CHESS F3 and A2 beam lines, (b) the diagram of the electronics layout: The top and bottom PIN diodes are connected to two Stanford Research SR570 current amplifiers followed by a 24-bit ADC and the data acquisition personal computer.

Image of FIG. 3.
FIG. 3.

(a) Normalized intensity measured with the Ar- scintillation monitor (red) in comparison with the ion chamber intensities. The X-ray intensity was reduced by closing the horizontal slit aperture. (b) Linear dependence between the ion chamber and the Ar-scintillation monitor responses.

Image of FIG. 4.
FIG. 4.

(a) Top and bottom signals from the Ar-scintillation BPM (blue and red) and the X-ray position from D/S (black). (b) The measured beam position as a function of Z-stage height (dots) with the linear fit (red line).

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/content/aip/journal/rsi/84/5/10.1063/1.4807698
2013-05-24
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Compact integrated X-ray intensity and beam position monitor based on rare gas scintillation
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/5/10.1063/1.4807698
10.1063/1.4807698
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