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Using Bayesian analysis and Gaussian processes to infer electron temperature and density profiles on the Mega-Ampere Spherical Tokamak experiment
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10.1063/1.4811378
/content/aip/journal/rsi/84/6/10.1063/1.4811378
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/6/10.1063/1.4811378

Figures

Image of FIG. 1.
FIG. 1.

Comparison of inferred and profiles inferred from TS data for shot #24 600 at 280 ms, with and profiles corresponding to (a) and (b), respectively. The heavy lines indicate profiles inferred using the Bayesian analysis described in Sec. II . The dashed lines marked with diamonds and coloured region reflect MAST scheduler output for the corresponding profiles and uncertainty, respectively. Uncertainties associated with the expectation of the Bayesian inferred profiles are too small to resolve visually and have been suppressed from both figures.

Tables

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Table I.

Table of sampling statistics of nuisance parameters used in the inference of and profiles from TS data for discharge #24 600 at 280 ms.

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/content/aip/journal/rsi/84/6/10.1063/1.4811378
2013-06-25
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Using Bayesian analysis and Gaussian processes to infer electron temperature and density profiles on the Mega-Ampere Spherical Tokamak experiment
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/6/10.1063/1.4811378
10.1063/1.4811378
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