Photographs (a) and schematic illustrations (b) of a DP-AFM system.
Schematic of OBD sensors and optical microscope. The inset shows an optical micrograph of two cantilevers approaching a Si substrate with Au electrodes.
Photographs of an inertia slider (a), a tube-type probe scanner (b), a piezo-stack-type probe scanner (c), and a tripod-type probe scanner (d). A cantilever holder is not mounted in the tripod scanner shown in (d). (e) Definition of hysteresis factor (HF) for probe scanners.
Thermal noise spectrum of a cantilever. Theoretical thermal Brownian noise, excluding the sensor noise density (N ds) from the total noise density (N total) in Eq. (1) , is also shown.
(a) Topographic image of a polydiacetylene single crystal surface obtained in air. (b) Topographic image of a pentacene thin film deposited on a Si substrate with a SiO2 layer; the image was obtained with the sample in vacuum.
(a) Schematic of the experimental setup for DP-AFM operation in liquid environments. (b) Topographic image of a Au(111) surface on a mica substrate obtained with the sample in ultrapure water.
(a) Topographic image of a Au nanorod on a SiO2 surface. (b) I–V characteristics between the two probes contacting a Au nanorod. The inset shows a schematic of the measurement setup.
(a) and (b) Topographic images of a Au nanorod on a SiO2 surface obtained with two probes, which are referred to as the pick-up probe and imaging probe. (c) Topographic image of the area almost the same as that shown in (a) obtained with the pick-up probe after the Au nanorod was picked up. The imaging was unstable, and no features were observed. (d) Topographic image of the area almost the same as that shown in (b) obtained with the imaging probe after translation of the probes. (e) Scanning electron micrograph of the tip apex of the pick-up probe after the Au nanorod was picked up.
Characteristics of probe scanners.
Article metrics loading...
Full text loading...