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Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams
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10.1063/1.4816535
/content/aip/journal/rsi/84/8/10.1063/1.4816535
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/8/10.1063/1.4816535

Figures

Image of FIG. 1.
FIG. 1.

Photographs (a) and schematic illustrations (b) of a DP-AFM system.

Image of FIG. 2.
FIG. 2.

Schematic of OBD sensors and optical microscope. The inset shows an optical micrograph of two cantilevers approaching a Si substrate with Au electrodes.

Image of FIG. 3.
FIG. 3.

Photographs of an inertia slider (a), a tube-type probe scanner (b), a piezo-stack-type probe scanner (c), and a tripod-type probe scanner (d). A cantilever holder is not mounted in the tripod scanner shown in (d). (e) Definition of hysteresis factor (HF) for probe scanners.

Image of FIG. 4.
FIG. 4.

Thermal noise spectrum of a cantilever. Theoretical thermal Brownian noise, excluding the sensor noise density ( ) from the total noise density ( ) in Eq. (1) , is also shown.

Image of FIG. 5.
FIG. 5.

(a) Topographic image of a polydiacetylene single crystal surface obtained in air. (b) Topographic image of a pentacene thin film deposited on a Si substrate with a SiO layer; the image was obtained with the sample in vacuum.

Image of FIG. 6.
FIG. 6.

(a) Schematic of the experimental setup for DP-AFM operation in liquid environments. (b) Topographic image of a Au(111) surface on a mica substrate obtained with the sample in ultrapure water.

Image of FIG. 7.
FIG. 7.

(a) Topographic image of a Au nanorod on a SiO surface. (b) I–V characteristics between the two probes contacting a Au nanorod. The inset shows a schematic of the measurement setup.

Image of FIG. 8.
FIG. 8.

(a) and (b) Topographic images of a Au nanorod on a SiO surface obtained with two probes, which are referred to as the pick-up probe and imaging probe. (c) Topographic image of the area almost the same as that shown in (a) obtained with the pick-up probe after the Au nanorod was picked up. The imaging was unstable, and no features were observed. (d) Topographic image of the area almost the same as that shown in (b) obtained with the imaging probe after translation of the probes. (e) Scanning electron micrograph of the tip apex of the pick-up probe after the Au nanorod was picked up.

Tables

Generic image for table
Table I.

Characteristics of probe scanners.

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/content/aip/journal/rsi/84/8/10.1063/1.4816535
2013-08-01
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/8/10.1063/1.4816535
10.1063/1.4816535
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