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On-chip terahertz spectroscopic techniques for measuring mesoscopic quantum systems
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10.1063/1.4816736
/content/aip/journal/rsi/84/8/10.1063/1.4816736
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/8/10.1063/1.4816736
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

THz excitation and detection apparatus located inside the dilution refrigerator.

Image of FIG. 2.
FIG. 2.

Schematic diagram of a THz CPW formed on a continuous LT-GaAs surface (dark regions) comprising a gap–center conductor–gap of dimensions 20 m–30 m–20 m. PC switches 1–4 are defined by 30-m-width probe arms, separated from the ground planes by a 5 m gap. Switch pairs are separated by 1.2 mm.

Image of FIG. 3.
FIG. 3.

The layer structure of a 2DES heterostructure monolithically integrated with a photoconductive LT-GaAs layer, grown by MBE.

Image of FIG. 4.
FIG. 4.

(a) Input (solid) and output (dashed) THz pulses measured in the dilution refrigerator at 200 mK (pulse delay artificially removed for comparison); (b) and (c) spatial maps recorded at 400 mK and 12 T magnetic field, of the pump switch photocurrent and the corresponding peak-to-peak transmitted THz signal amplitude, respectively.

Image of FIG. 5.
FIG. 5.

A THz CPW with a 2DES mesa integrated into the center conductor. The second mesa is present to prevent over-etching of the 2DES region when etching down to the LT-GaAs surface.

Image of FIG. 6.
FIG. 6.

Input (solid) and output (dashed) THz pulses measured at: (a) room temperature and (b) 4 K, respectively. Inset (b) area under the output pulse as a percentage of the input pulse for the slotline (circles) and coplanar (squares) guided modes, as a function of temperature; and (c) transmitted THz signal amplitude as a function of magnetic field (symbols) compared with the 2-terminal mesa resistance (line), measured at a dilution refrigerator temperature of 200 mK.

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/content/aip/journal/rsi/84/8/10.1063/1.4816736
2013-08-01
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: On-chip terahertz spectroscopic techniques for measuring mesoscopic quantum systems
http://aip.metastore.ingenta.com/content/aip/journal/rsi/84/8/10.1063/1.4816736
10.1063/1.4816736
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