The optical layout of the cavity trap.
A comparison of trap lifetimes with and without fast stabilization.
(a) The control voltage signal sent to strong beam AOM to vary the input power into the cavity. (b) The cavity transmission as a function of time while the input power is varied. (c) The error signal created by locking beam as the input intensity is modulated.
(a) The PDH error signal produced while the strong beam is scanned in frequency. (b) A graph of cavity transmission as a function of cavity detuning.
(a) The black curve shows the drift in piezo voltage which is used to lock the circuit after the strong beam was turned on at t = 30 s. The slow drift is due to mirror heating caused by the intra-cavity light. Also shown as the gray curve is the variation in cavity transmission over time. (b) The calculated radius of curvature of cavity mirrors with the intensity on the cavity mirrors.
Graphs of the fraction of trapped atoms as a function of trap modulation frequency. The reduction in atom number indicates the location of the radial and axial trap frequencies. Significant loss also occurs at twice the trap frequencies.
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