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DEIMOS: A beamline dedicated to dichroism measurements in the 350–2500 eV energy range
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Image of FIG. 1.
FIG. 1.

Horizontal and vertical view of the schematic layout of the DEIMOS beamline from the source (on the left) to the sample (on the right).

Image of FIG. 2.
FIG. 2.

K-edge XA spectrum for N2 with c set to 0.1 and the exit slits open at 20 μm; dotted curve: experimental data, red curve: total spectrum of 6 Lorentzians, and green curves: individual Lorentzian contributions.

Image of FIG. 3.
FIG. 3.

XAS and XMCD at the edges of Co. The solid lines correspond to the measurements obtained using the EMPHU-65 while the doted XMCD spectrum is given as a reference and has been obtained using the HU-52 in the same conditions.

Image of FIG. 4.
FIG. 4.

Flux measured after the Wolter chamber for different light polarizations and a ring current of 430 mA. (a) Using the AML grating (exit slit set to 200 μm) and (b) the VGD grating (exit slit set to 100 μm). The 1st harmonic goes up to ∼1300 eV and the 2nd (dashed lines) and 3rd harmonics (dotted lines) are used to go to higher energies value. The symbols -×- in blue (b) represent the efficiency of the M1a-M1c optical path over M1a-M1b while the green -*- (a) illustrate the efficiency of the AML grating over the VGD. The Si- edge is due to the material of the diode while the Mo- and Pt- edges correspond to the optical coating materials.

Image of FIG. 5.
FIG. 5.

X-ray absorption spectrum of S- and Mo- edges for MoS.


Generic image for table
Table I.

Undulators parameters.

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Table II.

Optical parameters.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: DEIMOS: A beamline dedicated to dichroism measurements in the 350–2500 eV energy range