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Soft x-ray intensity profile measurements of electron cyclotron heated plasmas using semiconductor detector arrays in GAMMA 10 tandem mirrora)
a)Contributed paper, published as part of the Proceedings of the 20th Topical Conference on High-Temperature Plasma Diagnostics, Atlanta, Georgia, USA, June 2014.
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10.1063/1.4885495
/content/aip/journal/rsi/85/11/10.1063/1.4885495
http://aip.metastore.ingenta.com/content/aip/journal/rsi/85/11/10.1063/1.4885495
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/content/aip/journal/rsi/85/11/10.1063/1.4885495
2014-07-08
2014-09-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Soft x-ray intensity profile measurements of electron cyclotron heated plasmas using semiconductor detector arrays in GAMMA 10 tandem mirrora)
http://aip.metastore.ingenta.com/content/aip/journal/rsi/85/11/10.1063/1.4885495
10.1063/1.4885495
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