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Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfacesa)
a)Contributed paper, published as part of the Proceedings of the 15th International Conference on Ion Sources, Chiba, Japan, September 2013.
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10.1063/1.4855455
/content/aip/journal/rsi/85/2/10.1063/1.4855455
http://aip.metastore.ingenta.com/content/aip/journal/rsi/85/2/10.1063/1.4855455
/content/aip/journal/rsi/85/2/10.1063/1.4855455
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/content/aip/journal/rsi/85/2/10.1063/1.4855455
2014-01-07
2014-11-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfacesa)
http://aip.metastore.ingenta.com/content/aip/journal/rsi/85/2/10.1063/1.4855455
10.1063/1.4855455
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