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A device for the application of uniaxial strain to single crystal samples for use in synchrotron radiation experiments
15.D. Butkovičová, X. Marti, V. Saidl, E. Schmoranzerová-Rozkotová, P. Wadley, V. Holý, and P. Nmec, Rev. Sci. Instrum. 84, 103902 (2013).
21.Private communication with physik instrumente technical support.
24.M. Yi, D. H. Lu, R. G. Moore, K. Kihou, C.-H. Lee, A. Iyo, H. Eisaki, T. Yoshida, A. Fujimori, and Z.-X. Shen, New J. Phys. 14, 073019 (2012).
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We present the design, construction, and testing of a straining device compatible with many different synchrotron radiation techniques, in a wide range of experimental environments (including low temperature, high field and ultra-high vacuum). The device has been tested by X-ray diffraction on single crystal samples of quasi-one-dimensional Cs2
6Se6 and K2
6Se6, in which microscopic strains up to a Δc/c = 0.12% ± 0.01% change in the c lattice parameters have been achieved. We have also used the device in an inelastic X-ray scattering experiment, to probe the strain-dependent speed of sound ν along the c axis. A reduction Δν/ν of up to −3.8% was obtained at a strain of Δc/c = 0.25% in K2
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