Skip to main content
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
/content/aip/journal/rsi/86/10/10.1063/1.4933383
1.
1.Y. Feng, J. Wang, A. Palmer, J. A. Aguiar, B. Mihaila, J.-Q. Yan, P. B. Littlewood, and T. F. Rosenbaum, Nat. Commun. 5, 4218 (2014).
http://dx.doi.org/10.1038/ncomms5218
2.
2.T. Park, F. Ronning, H. Q. Yuan, M. B. Salamon, R. Movshovich, J. L. Sarrao, and J. D. Thompson, Nature 440, 65-68 (2006).
http://dx.doi.org/10.1038/nature04571
3.
3.J. H. Lee et al., Nature 466, 954-958 (2010).
http://dx.doi.org/10.1038/nature09331
4.
4.J. Cao and J. Wu, Mater. Sci. Eng., R 71, 35-52 (2011).
http://dx.doi.org/10.1016/j.mser.2010.08.001
5.
5.R. Hühne, D. Okai, K. Dörr, S. Trommler, A. Herklotz, B. Holzapfel, and L. Schultz, Supercond. Sci. Technol. 21, 075020 (2008).
http://dx.doi.org/10.1088/0953-2048/21/7/075020
6.
6.A. Herklotz, M. D Biegalski, H. Kim, L. Schultz, K. Dörr, and H. M. Christen, New J. Phys. 12, 113053 (2010).
http://dx.doi.org/10.1088/1367-2630/12/11/113053
7.
7.C. W. Hicks et al., Science 344, 283-285 (2014).
http://dx.doi.org/10.1126/science.1248292
8.
8.G. X. Tessema et al., Phys. Rev. B 43, 3434-3437 (1991).
http://dx.doi.org/10.1103/PhysRevB.43.3434
9.
9.M. Yi, Donghui et al., Proc. Natl. Acad. Sci. U. S. A. 108, 6878-6883 (2011).
http://dx.doi.org/10.1073/pnas.1015572108
10.
10.J. H. Haeni, P. Irvin, W. Chang, R. Uecker, P. Reiche, and Y. L. Li, Nature 430, 583-586 (2004).
http://dx.doi.org/10.1038/nature02773
11.
11.C. W. Hicks, M. E. Barber, S. D. Edkins, D. O. Brodsky, and A. P. Mackenzie, Rev. Sci. Instrum. 85, 065003 (2014).
http://dx.doi.org/10.1063/1.4881611
12.
12.M. Shayegan, K. Karrai, Y. P. Shkolnikov, K. Vakili, E. P. De Poortere, and S. Manus, Appl. Phys. Lett. 83, 5235-5237 (2003).
http://dx.doi.org/10.1063/1.1635963
13.
13.D. C. Van Der Laan and J. W. Ekin, Appl. Phys. Lett. 90, 052506 (2007).
http://dx.doi.org/10.1063/1.2435612
14.
14.E. P. Stillwell, M. J. Skove, and J. H. Davis, Rev. Sci. Instrum. 39, 155-157 (1968).
http://dx.doi.org/10.1063/1.1683303
15.
15.D. Butkovičová, X. Marti, V. Saidl, E. Schmoranzerová-Rozkotová, P. Wadley, V. Holý, and P. Nmec, Rev. Sci. Instrum. 84, 103902 (2013).
http://dx.doi.org/10.1063/1.4823520
16.
16.A. P. Petrović et al., Phys. Rev. B 82, 235128 (2010).
http://dx.doi.org/10.1103/PhysRevB.82.235128
17.
17.M. Potel and R. Chevrel, J. Solid State Chem. 35, 286-290 (1980).
http://dx.doi.org/10.1016/0022-4596(80)90505-8
18.
18.F. Ribeiro, D. Roundy, and M. Cohen, Phys. Rev. B 65, 153401 (2002).
http://dx.doi.org/10.1103/PhysRevB.65.153401
19.
19.D. Çakr, E. Durgun, O. Gülseren, and S. Ciraci, Phys. Rev. B 74, 235433 (2006).
http://dx.doi.org/10.1103/physrevb.74.235433
20.
20.See http://oldwww.epotek.com/SSCDocs/datasheets/E4110.PDF for EPO-TEK silver epoxy E4110 datasheet.
21.
21.Private communication with physik instrumente technical support.
22.
22.See http://piceramic.com/product-detail-page/p-111-p-151-102900.html for Piezoelectric actuator datasheet.
23.
23.M. Krisch and F. Sette, Top. Appl. Phys. 108, 317-369 (2007).
http://dx.doi.org/10.1007/978-3-540-34436-0_5
24.
24.M. Yi, D. H. Lu, R. G. Moore, K. Kihou, C.-H. Lee, A. Iyo, H. Eisaki, T. Yoshida, A. Fujimori, and Z.-X. Shen, New J. Phys. 14, 073019 (2012).
http://dx.doi.org/10.1088/1367-2630/14/7/073019
25.
25.I. R. Fisher, L. Degiorgi, and Z. X. Shen, Rep. Prog. Phys. 74, 124506 (2011).
http://dx.doi.org/10.1088/0034-4885/74/12/124506
http://aip.metastore.ingenta.com/content/aip/journal/rsi/86/10/10.1063/1.4933383
Loading
/content/aip/journal/rsi/86/10/10.1063/1.4933383
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/rsi/86/10/10.1063/1.4933383
2015-10-28
2016-09-26

Abstract

We present the design, construction, and testing of a straining device compatible with many different synchrotron radiation techniques, in a wide range of experimental environments (including low temperature, high field and ultra-high vacuum). The device has been tested by X-ray diffraction on single crystal samples of quasi-one-dimensional Cs Mo Se and K Mo Se, in which microscopic strains up to a Δ/ = 0.12% ± 0.01% change in the lattice parameters have been achieved. We have also used the device in an inelastic X-ray scattering experiment, to probe the strain-dependent speed of sound along the axis. A reduction Δ/ of up to −3.8% was obtained at a strain of Δ/ = 0.25% in K Mo Se.

Loading

Full text loading...

/deliver/fulltext/aip/journal/rsi/86/10/1.4933383.html;jsessionid=9Yni1H0ipGYMjbosXMjM5I7l.x-aip-live-06?itemId=/content/aip/journal/rsi/86/10/10.1063/1.4933383&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/rsi
true
true

Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=rsi.aip.org/86/10/10.1063/1.4933383&pageURL=http://scitation.aip.org/content/aip/journal/rsi/86/10/10.1063/1.4933383'
Right1,Right2,Right3,