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/content/aip/journal/rsi/86/11/10.1063/1.4936352
2015-11-30
2016-12-08

Abstract

By monitoring the reflectance of a sample surface during deposition of a thin organic film, one can obtain information with submonolayer resolution in real-time. A special kind of optical spectroscopy is Differential Reflectance Spectroscopy (DRS), which compares the reflectance before and during deposition of a thin film or any other change of the surface optical properties. In this work, we present an extended DRS setup that allows monitoring simultaneously both linear polarization states ( and ) of the reflected light. We implement polarization-dependent DRS to monitor the growth of perflouropentacene thin films on a Ag(110) single crystal. The setup allows us to deduce the optical anisotropy of the sample and, in particular, the preferred orientation of the molecules on the surface.

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