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1.
1.J. Rogal, K. Reuter, and M. Scheffler, “CO oxidation on Pd(100) at technologically relevant pressure conditions: First-principles kinetic Monte Carlo study,” Phys. Rev. B 77, 155410 (2008).
http://dx.doi.org/10.1103/PhysRevB.77.155410
2.
2.B. Corain, G. Schmid, and N. Toshima, Metal Nanoclusters in Catalysis and Materials Science (Elsevier, 2011).
3.
3.W. C. Conner, Jr. and J. L. Falconer, “Spillover in heterogeneous catalysis,” Chem. Rev. 95, 759 (1995).
http://dx.doi.org/10.1021/cr00035a014
4.
4.J. Y. Park, J. R. Renzas, A. M. Contreras, and G. A. Somorjai, “The genesis and importance of oxide–metal interface controlled heterogeneous catalysis; the catalytic nanodiode,” Top. Catal. 46, 217 (2007).
http://dx.doi.org/10.1007/s11244-007-0331-7
5.
5.G. Rupprechter, “Sum frequency laser spectroscopy during chemical reactions on surfaces,” MRS Bull. 32, 1031 (2007).
http://dx.doi.org/10.1557/mrs2007.212
6.
6.H. Bluhm, M. Havecker, A. Knop-Gericke, M. Kiskinova, R. Schlogl, and M. Salmeron, “In situ x-ray photoelectron spectroscopy studies of gas-solid interfaces at near-ambient conditions,” MRS Bull. 32, 1022 (2007).
http://dx.doi.org/10.1557/mrs2007.211
7.
7.R. van Rijn, M. Ackermann, O. Balmes, T. Dufrane, A. Geluk, H. Gonzalez, H. Isern, E. de Kuyper, L. Petit, V. A. Sole, D. Wermeille, R. Felici, and J. W. M. Frenken, “Ultrahigh vacuum/high-pressure flow reactor for surface x-ray diffraction and grazing incidence small angle x-ray scattering studies close to conditions for industrial catalysis,” Rev. Sci. Instrum. 81, 014101 (2010).
http://dx.doi.org/10.1063/1.3290420
8.
8.J. F. Creemer, S. Helveg, G. H. Hoveling, S. Ullmann, A. M. Molenbroek, P. M. Sarro, and H. W. Zandbergen, “Atomic-scale electron microscopy at ambient pressure,” Ultramicroscopy 108, 993 (2008).
http://dx.doi.org/10.1016/j.ultramic.2008.04.014
9.
9.J. F. Creemer, F. Santagata, B. Morana, L. Mele, T. Alan, E. Iervolino, G. Pandraud, and P. M. Sarro, “An all-in-one nanoreactor for high-resolution microscopy on nanomaterials at high pressures,” in Proceedings of the IEEE 24th International Conference on Micro Electro Mechanical Systems (IEEE, 2011), p. 1103.
http://dx.doi.org/10.1109/MEMSYS.2011.5734622
10.
10.B. J. McIntyre, M. Salmeron, and G. A. Somorjai, “A scanning tunneling microscope that operates at high pressures and high temperatures (430 K) and during catalytic reactions,” Catal. Lett. 14, 263 (1992).
http://dx.doi.org/10.1007/BF00769663
11.
11.C. T. Herbschleb, P. C. van der Tuijn, S. B. Roobol, V. Navarro, J. W. Bakker, Q. Liu, D. Stoltz, M. E. Cañas-Ventura, G. Verdoes, M. A. van Spronsen, M. Bergman, L. Crama, I. Taminiau, A. Ofitserov, G. J. C. van Baarle, and J. W. M. Frenken, “The ReactorSTM: Atomically resolved scanning tunneling microscopy under high-pressure, high-temperature catalytic reaction conditions,” Rev. Sci. Instrum. 85, 083703 (2014).
http://dx.doi.org/10.1063/1.4891811
12.
12.M. A. van Spronsen, G. J. C. van Baarle, C. T. Herbschleb, J. W. M. Frenken, and I. M. N. Groot, “High-pressure operando STM studies giving insight in CO oxidation and NO reduction over Pt(110),” Catal. Today 244, 85 (2015).
http://dx.doi.org/10.1016/j.cattod.2014.07.008
13.
13.D. D’Agostino, D. Jay, and H. McNally, “Development and testing of hyperbaric atomic force microscopy (AFM) for biological applications,” Microsc. Microanal. 16, 1042 (2010).
http://dx.doi.org/10.1017/S1431927610057739
14.
14.J. Lievonen, K. Ranttila, and M. Ahlskog, “Environmental chamber for an atomic force microscope,” Rev. Sci. Instrum. 78, 043703 (2007).
http://dx.doi.org/10.1063/1.2719598
15.
15.S. R. Higgins, C. M. Eggleston, K. G. Knauss, and C. O. Boro, “A hydrothermal atomic force microscope for imaging in aqueous solution up to 150 °C,” Rev. Sci. Instrum. 69, 2994 (1998).
http://dx.doi.org/10.1063/1.1149226
16.
16.A. S. Lea, S. R. Higgins, K. G. Knauss, and K. M. Rosso, “A high-pressure atomic force microscope for imaging in supercritical carbon dioxide,” Rev. Sci. Instrum. 82, 043709 (2011).
http://dx.doi.org/10.1063/1.3580603
17.
17.F. J. Giessibl, S. Hembacher, and H. Bielefeldt, “Subatomic features on the silicon (111) − (7 × 7) surface observed by atomic force microscopy,” Science 289, 422 (2000).
http://dx.doi.org/10.1126/science.289.5478.422
18.
18.L. Gross, F. Mohn, N. Moll, P. Liljeroth, and G. Meyer, “The chemical structure of a molecule resolved by atomic force microscopy,” Science 325, 1110 (2009).
http://dx.doi.org/10.1126/science.1176210
19.
19.F. J. Giessibl, “High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork,” Appl. Phys. Lett. 73, 3956 (1998).
http://dx.doi.org/10.1063/1.122948
20.
20.EBL #2 piezoceramic tube, EBL Products, http://www.eblproducts.com/.
21.
21.Z. Xue, M. J. Strouse, D. K. Shuh, C. B. Knobler, H. D. Kaesz, R. F. Hicks, and R. S. Williams, “Characterization of (methylcyclopentadienyl)trimethylplatinum and low-temperature organometallic chemical vapor deposition of platinum metal,” J. Am. Chem. Soc. 111, 8779 (1989).
http://dx.doi.org/10.1021/ja00206a002
22.
22.Macor Machinable Glass Ceramic, Corning Inc., http://www.corning.com/.
23.
23.A. Botman, M. Hesselberth, and J. J. L. Mulders, “Improving the conductivity of platinum-containing nano-structures created by electron-beam-induced deposition,” Microelectron. Eng. 85, 1139 (2008).
http://dx.doi.org/10.1016/j.mee.2007.12.036
24.
24.F. J. Giessibl, “Advances in atomic force microscopy,” Rev. Mod. Phys. 75, 949 (2003).
http://dx.doi.org/10.1103/RevModPhys.75.949
25.
25.R. Grober, J. Acimovic, J. Schuck, D. Hessman, P. J. Kindlemann, J. Hespanha, and A. S. Morse, “Fundamental limits to force detection using quartz tuning forks,” Rev. Sci. Instrum. 71, 2776 (2000).
http://dx.doi.org/10.1063/1.1150691
26.
26.M. J. Rost, L. Crama, P. Schakel, E. van Tol, G. van Velzen-Williams, C. F. Overgauw, H. Ter Horst, H. Dekker, B. Okhuijsen, and M. Seynen, “Scanning probe microscopes go video rate and beyond,” Rev. Sci. Instrum. 76, 053710 (2005).
http://dx.doi.org/10.1063/1.1915288
27.
27.M. E. Messing, R. Westerström, B. O. Meuller, S. Blomberg, J. Gustafson, J. N. Andersen, E. Lundgren, R. van Rijn, O. Balmes, H. Bluhm, and K. Deppert, “Generation of Pd model catalyst nanoparticles by spark discharge,” J. Phys. Chem. C 114, 9257 (2010).
http://dx.doi.org/10.1021/jp101390a
28.
28.J. S. Villarrubia, “Algorithms for scanned probe microscope image simulation, surface reconstruction, and tip estimation,” J. Res. Natl. Inst. Stand. Technol. 102, 425 (1997).
http://dx.doi.org/10.6028/jres.102.030
29.
29.E. P. Eernisse, R. W. Ward, and R. B. Wiggins, “Survey of quartz bulk resonator sensor technologies,” IEEE Trans. Ultrason. Ferroelectr. Freq. Control 35, 323 (1988).
http://dx.doi.org/10.1109/58.20453
30.
30.K. K. Kanazawa and J. G. Gordon II, “The oscillation frequency of a quartz resonator in contact with liquid,” Anal. Chim. Acta 175, 99 (1985).
http://dx.doi.org/10.1016/S0003-2670(00)82721-X
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/content/aip/journal/rsi/86/3/10.1063/1.4916194
2015-03-30
2016-12-07

Abstract

An Atomic Force Microscope (AFM) has been integrated in a miniature high-pressure flow reactor for observations of heterogeneous catalytic reactions under conditions similar to those of industrial processes. The AFM can image model catalysts such as those consisting of metal nanoparticles on flat oxide supports in a gas atmosphere up to 6 bar and at a temperature up to 600 K, while the catalytic activity can be measured using mass spectrometry. The high-pressure reactor is placed inside an Ultrahigh Vacuum (UHV) system to supplement it with standard UHV sample preparation and characterization techniques. To demonstrate that this instrument successfully bridges both the and the , images have been recorded of supported palladium nanoparticles catalyzing the oxidation of carbon monoxide under high-pressure, high-temperature conditions.

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