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Microscopy of Materials: Modern Imaging Methods Using Electron, X‐ray and Ion Beams

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10.1063/1.3024411
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44c12fabd628bd00ff76c1a6b35267a4 ptol.magazine_articlezxybnytfddd
Scitation: Microscopy of Materials: Modern Imaging Methods Using Electron, X‐ray and Ion Beams
http://aip.metastore.ingenta.com/content/aip/magazine/physicstoday/article/29/10/10.1063/1.3024411
10.1063/1.3024411
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