- Conference date: 2-6 Aug 1999
- Location: Berkeley, California (USA)
Speckle Pattern Correlation Interferometry (SPCI) is a well-established technique in the visible-light regime for observing surface disturbances. Although not a direct imaging technique, SPCI gives full-field, high-resolution information about an object’s motion. Since x-ray synchrotron radiation beamlines with high coherent flux have allowed the observation of x-ray speckle, x-ray SPCI could provide a means to measure strains and other quasi-static motions in disordered systems. This paper therefore examines the feasibility of an x-ray speckle correlation interferometer.
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