- Conference date: 8-12 October 2000
- Location: Knoxville, Tennessee (USA)
The electronic processes governing keV ion-beam sputtering of metals are studied by double resonance laser ionization mass spectrometry of the ejected metal atoms. We present the population partitions over the ground and metastable states of sputtered Cu and Sr atoms and their state-selective flight-time distributions. These results support the model indicating resonant electron transfer from the metal to the sputtered particle as a key mechanism to populate the electronic states.
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