Skip to main content
banner image
Trace element analysis of precious metals in minerals by time-of-flight resonance ionization mass spectrometry (TOF-RIMS)
USD
/content/aip/proceeding/aipcp/10.1063/1.1405582
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.1405582
/content/aip/proceeding/aipcp/10.1063/1.1405582
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/proceeding/aipcp/10.1063/1.1405582
2001-08-22
2016-02-10

Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd