- Conference date: 25-29 August 2003
- Location: San Francisco, California (USA)
We have incorporated differential phase‐contrast (DPC) detection in a hard x‐ray fluorescence microprobe at the Advanced Photon Source. We report a straightforward implementation of unidirectional DPC and demonstrate that it is highly advantageous for imaging low‐Z specimens with hard x‐rays (10keV). Phase‐contrast imaging of a specimen can be used to acquire fast overview images of samples that allow more precise targeting of time consuming fluorescence scans. In order to get an overview of the elemental content of a specimen in these fly‐scans, we have also implemented a fast detection of total fluorescence yield. Additionally, a DPC image of the specimen is obtained simultaneously with the fluorescence maps in normal step‐scanning mode, to facilitate a direct comparison and co‐registration with visible light micrographs.
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