- Conference date: 6-13 March 2004
- Location: Kirchberg, Tirol (Austria)
We have developed a quantitative model that explains the phase shifts observed in Scanning Conductance Microscopy, by considering the change in the total capacitance of the tip‐sample‐substrate system. We show excellent agreement with data on samples of (conducting) single wall carbon nanotubes and insulating polyethylene oxide (PEO) nanofibers. Data for large diameter, conducting doped polyaniline/PEO nanofibers are qualitatively explained. This quantitative approach is used to determine the dielectric constant of PEO nanofiber ε f = 2.88 ± 0.12, a general method that can be extended to other dielectric nanowires.
- Carbon nanotubes
- Scanning microscopy
- Conducting polymers
- Dielectric constant
Data & Media loading...
Article metrics loading...