- Conference date: 5-8 October 2004
- Location: Toki (Japan)
An electron beam ion trap (EBIT) is a versatile device for studying the physics of highly charged ions. Since the first EBIT was developed about 15 years ago, about 10 EBITs have been constructed in the world and many atomic data for highly charged ions have been accumulated by using them. The data contain various important information which can be obtained only with an EBIT. This paper presents the potential of an EBIT for atomic data production by introducing some results obtained with EBITs.
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