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A Vacuum Soft X‐Ray Reflectometer for the Characterization of Multilayer Mirrors by Synchrotron Radiation at DAΦNE
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10.1063/1.2436126
/content/aip/proceeding/aipcp/10.1063/1.2436126
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.2436126
/content/aip/proceeding/aipcp/10.1063/1.2436126
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/content/aip/proceeding/aipcp/10.1063/1.2436126
2007-01-19
2014-11-25
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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: A Vacuum Soft X‐Ray Reflectometer for the Characterization of Multilayer Mirrors by Synchrotron Radiation at DAΦNE
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.2436126
10.1063/1.2436126
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