- Conference date: 28 May-2 June 2006
- Location: Daegu (Korea)
High‐reflectivity multilayers are required in many soft X‐ray researches, from nowadays Synchrotron Radiation (SR) to future Free Electron Laser (FEL) optics. These synthetic reflectors are capable of working at near‐normal incidence covering the lower X energy range not accessible by crystal diffraction. Recently, the deposition of such devices has progressed at INFN Legnaro Laboratories (LNL), giving robust Si/Mo mirror devices and first Ni/Ti and Ni/TiO2 multilayers. To test these new optics, at INFN Frascati Laboratories (LNF) a new vacuum compatible reflectometer has been assembled and commissioned in 2005. The final system is a θ‐2θ diffractometer in vacuum environment, endowed with high angular resolution and repeatability and absolute detectors. A direct characterization of multilayer performances have been accomplished by SR from a wiggler source at DAΦNE. Results on characterization of the vacuum reflectometer and on the new Ni‐Ti based multilayers are presented.
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