- Conference date: 28 May-2 June 2006
- Location: Daegu (Korea)
We propose a novel fabrication scheme combining a mirror surfacing tool and an on‐line metrology instrument, the latter capable of controlling both figure and finish of an X‐ray mirror with an accuracy matching the challenging specifications of nanofocusing reflective optics for synchrotron and FEL X‐ray beams. This approach will be complementary to the present technologies. The paper reviews some recent achievements and presents pertinent examples of on‐line diagnostics performed at the ESRF BM05 beamline for which X‐rays prove to be a unique probe.
Data & Media loading...
Article metrics loading...