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On‐Line Mirror Surfacing Monitored by X‐ray Shearing Interferometry and X‐ray Scattering
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10.1063/1.2436176
/content/aip/proceeding/aipcp/10.1063/1.2436176
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.2436176
/content/aip/proceeding/aipcp/10.1063/1.2436176
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/content/aip/proceeding/aipcp/10.1063/1.2436176
2007-01-19
2014-12-21
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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: On‐Line Mirror Surfacing Monitored by X‐ray Shearing Interferometry and X‐ray Scattering
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.2436176
10.1063/1.2436176
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