- Conference date: 15-17 January 2007
- Location: Shiga (Japan)
We report that the magnified imaging using the portable synchrotron named MIRRORCLE has unique advantages for non‐destructive inspection (NDI) of some products. This machine is a high energy x‐ray source which can have a micron‐sized point source, which is different from the conventional synchrotron, linear accelerator and the x‐ray tube. The images produced with micron‐sized point source and wide spectrum can display in detail the industrial products containing several materials in detail. The obtained x‐ray images characterization is expected to provide a new tool for NDI of industrial products.
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