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Need for Standardization of EBSD Measurements for Microstructural Characterization of Thin Film Structures
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/content/aip/proceeding/aipcp/10.1063/1.2799364
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.2799364
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/content/aip/proceeding/aipcp/10.1063/1.2799364
2007-09-26
2015-02-28
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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: Need for Standardization of EBSD Measurements for Microstructural Characterization of Thin Film Structures
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.2799364
10.1063/1.2799364
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