1887
banner image
oa
Need for Standardization of EBSD Measurements for Microstructural Characterization of Thin Film Structures
Rent:
Rent this article for
Access full text Conference Paper
/content/aip/proceeding/aipcp/10.1063/1.2799364
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/proceeding/aipcp/10.1063/1.2799364
2007-09-26
2014-10-20
This is a required field
Please enter a valid email address
229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: Need for Standardization of EBSD Measurements for Microstructural Characterization of Thin Film Structures
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.2799364
10.1063/1.2799364
SEARCH_EXPAND_ITEM