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Dopant profiling in the TEM, progress towards quantitative electron holography.
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/content/aip/proceeding/aipcp/10.1063/1.2799424
2007-09-26
2014-10-24
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229c8a00d8fe88cf152414eb5d9cd803 conferences.conference_paperzxybnytfddd
Scitation: Dopant profiling in the TEM, progress towards quantitative electron holography.
http://aip.metastore.ingenta.com/content/aip/proceeding/aipcp/10.1063/1.2799424
10.1063/1.2799424
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